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Spectroscopic Ellipsometer-UV/VIS NIR
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产品名称:
Spectroscopic Ellipsometer-UV/VIS NIR
产品型号:
PhE-103
产品展商:
上海现科仪器有限公司
简单介绍
Introduction to the PHE 103 UV/VIS & NIR Spectroscopic Ellipsometer
The PHE-103 is a new model which adds the Transmission and Variable Angle Reflection function. This variable angle spectroscopic ellipsometers operating in the spectral range 250 -1700nm In the PHE-103 a broad band white light source is used to illuminate the sample spot. The layer stack imparts a change in state of polarization to the light and is reflected back through the analyzer and into the detector which are measured as the ellipsometric parameters of Psi and Delta. The spectral dependence of the refractive index and dielectric constants of the materials and much more are determined by fitting the measured data to a theoretical model which describes the layer structure in detail.
Spectroscopic Ellipsometer-UV/VIS NIR的详细介绍
Features of the PhE-101,PhE-102,Phe-103,PhE-104 Spectroscopic Ellipsometer Family
- Optional extension of spectral range into the NIR (700 - 1700 nm) or (700 - 2300 nm) ;
- Optional extension of UV-VIS range (190 - 1100 nm) ;
- Transmission and Variable Angle Reflection;
- Rotating Compensator (retarder) provides accurate measurement of any polarization state;
- Step scan analyzer for high speed low noise aquisition;
- Variable angle from 20-90°, automated angle with 20-90° is available;
- Vertical sample stage;
- Fast determination of thickness and refractive index of single or multi-layer samples;
- Broad range Psi and Delta data are measured automatically and fitted through the PHE-103 software;
- Includes PHE-103 software, the most comprehensive program available for data acquisition and analysis. It combines state-of-the-art mathematical fitting algorithms with a large selection of modeling options for fast, accurate data analysis. an advanced spectroscopic ellipsometry software;
- Built in library of materials properties, includes several hundreds materials models;
- Mixture of new materials by use of know material properties
Spectroscopic Ellipsometer-UV/VIS NIR
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